- NIWEEK 2016
JKI at NIWeek 2016
JKI attended the NIWeek 2016 conference in Austin, Texas. Our engineers gave three great presentations on LabVIEW related topics. We recorded the presentations and have made them available online. The abstracts and the links to each of the presentation recordings are below. Looking forward to see you at NIWeek 2017.
Jim Kring
CEO, Founder
Caraya: A New Take on LabVIEW Unit Testing - TS9754
Thursday 8/4/2016 2:15 PM - 16B
How often have you created a small debug VI to test your software but never created a unit test to cover the same functionality? Unit testing software code has significant benefits, yet very few LabVIEW developers use unit testing as part of their development process. Caraya is a new open source, unit test framework for LabVIEW that takes a whole new approach to unit testing. It makes unit testing a natural part of your development process. At this session, learn from a LabVIEW Champion and a Certified LabVIEW Architect how to test your code with Caraya.
Sarah Zalusky
Senior Project Engineer
Designing a LabVIEW Interface for .NET Applications - TS9757
Thursday 8/4/2016 1:00 PM - 19A
As software becomes more complex and interconnected, interfacing between programming languages grows increasingly important. At this session, get a practical guide to integrating your LabVIEW code with any .NET application. You achieve seamless integration by building LabVIEW code into a .NET assembly and using ZeroMQ (a lightweight message queueing software) to add support for event-driven interactions. This practical guide includes steps to create such an interface for your LabVIEW code (and exercise it in C#) and tips to avoid the common pitfalls of creating interops in LabVIEW.
Javier Ruiz
Senior Project Engineer
Ian McFarlane
Project Engineer
Artificial Intelligence With LabVIEW: Deep Learning-Based Classification and Control - TS9758
Wednesday 8/3/16 3:30 PM - 19B
Deep learning has revolutionized autonomous classification and control, from autonomous vehicles to robotics to scientific instruments to industrial quality control systems. Deep learning-based algorithms have outperformed traditional machine learning techniques in nearly all domains. JKI has developed deep learning-based real-time machine learning classifiers for LabVIEW Real-Time and LabVIEW FPGA to offer the latest AI techniques to NI embedded platforms. FPGAs allow the execution of these state-of-the-art algorithms in a power-efficient way. At this session, explore the science and the art of deep learning and examine real-time image classifications applicable to a wide variety of real-life problems.
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